Lecture
Revealing nanoscale structure and chemistry driving material performance using advanced electron microscopy
- at -
- B1.131
- Type: Lecture
Lecture description
Electron microscopy is a key enabler for advanced materials characterization, providing multimodal insights into structure, composition, and crystallography across length scales. In this presentation, we highlight application-driven workflows combining scanning electron microscopy (SEM), focused ion beam (FIB) techniques, and transmission electron microscopy (TEM) for a range of material classes.
For metals, integrated energy-dispersive X-ray spectroscopy (EDS) with ChemiSEM and ChemiPhase technologies enables rapid, automated compositional and phase analysis, complemented by electron backscatter diffraction (EBSD) for crystallographic characterization. In the food and soft-matter domain, environmental SEM (ESEM) enables imaging under elevated chamber pressures, allowing analysis of hydrated and beam-sensitive samples in their native state.
Applications in catalysis and energy materials demonstrate how high-resolution SEM and TEM provide complementary insights into morphology, nanoscale structure, and elemental distribution. FIB-SEM tomography further enables three-dimensional characterization, revealing internal architectures and supporting quantitative volumetric analysis. A dedicated TEM use case highlights nanoscale defect analysis and interface characterization critical for advanced materials development. Finally, particle analysis workflows are presented for cosmetics and additive manufacturing, enabling automated particle detection, classification, and statistical evaluation for quality control.
These case studies underline the versatility of integrated electron microscopy solutions for fast, reliable, and application-specific materials characterization.
For metals, integrated energy-dispersive X-ray spectroscopy (EDS) with ChemiSEM and ChemiPhase technologies enables rapid, automated compositional and phase analysis, complemented by electron backscatter diffraction (EBSD) for crystallographic characterization. In the food and soft-matter domain, environmental SEM (ESEM) enables imaging under elevated chamber pressures, allowing analysis of hydrated and beam-sensitive samples in their native state.
Applications in catalysis and energy materials demonstrate how high-resolution SEM and TEM provide complementary insights into morphology, nanoscale structure, and elemental distribution. FIB-SEM tomography further enables three-dimensional characterization, revealing internal architectures and supporting quantitative volumetric analysis. A dedicated TEM use case highlights nanoscale defect analysis and interface characterization critical for advanced materials development. Finally, particle analysis workflows are presented for cosmetics and additive manufacturing, enabling automated particle detection, classification, and statistical evaluation for quality control.
These case studies underline the versatility of integrated electron microscopy solutions for fast, reliable, and application-specific materials characterization.
