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Supporting program
Schedule
Detail
Lecture
Precision in the Nanometer Range: Advanced Optical Metrology for 3D Integration and Advanced Packaging
19.11.2025
at
10:00
-
10:30
Hall B2
B2.441
Language: English
Type: Lecture
Add to calendar
Lecture description
Beschreibung folgt in Kürze
Moderator
RJ
Robert Johanning
Country
Germany
Job Title
Scientific Associate
Company
Leibniz University Hannover, Cluster of Excellence PhoenixD
Speaker
EB
Etienne Babnik
Country
Germany
Job Title
Sales Manager
Company
NanoFocus AG
Further lectures
10:00
-
10:30
Precision in the Nanometer Range: Advanced Optical Metrology for 3D Integration and Advanced Packaging
Test and measurement, quality assurance
10:30
-
11:00
Entwicklungen im Verteidigungsmarkt und Relevanz für den Maschinenbau
Services
11:00
-
11:30
Next level sustainable semiconductor production: LCA, Supply Chain, and Process Innovation
Semiconductor production
11:30
-
12:00
vAI ProVision: Inspektion auf einem neuen Level
Test and measurement, quality assurance
13:15
-
14:15
Mikroelektronik in sicherheitsrelevanten Anwendungen - welche Maßnahmen für Sicherheit entlang der Lieferketten sind notwendig?
Semiconductor production
14:15
-
14:25
Introduction to Printed Electronics
Organic and printed electronics
3D Printing, Additive Manufacturing
14:25
-
14:45
Printed Electronics – current applications and future trends
Organic and printed electronics
14:45
-
14:55
Manufacturing and applications of large-area LED foils
Organic and printed electronics
15:05
-
15:25
Hybrid electronics compared to conventional PCBs: their advantages and challenges
Organic and printed electronics
15:25
-
15:45
VTT pilot services for supporting and accelerating flexible electronics R&D
Organic and printed electronics
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