Over time, test systems have evolved from simple analog voltage measurement instruments into sophisticated and complex machines. While expectation is that decades of research & development in this space would result in highly polished systems, the reality is far from ideal.
In this presentation, we will explain what a measurement system consists of, identify its main components, and describe how it affects system reliability and measurement speed. We aim to demonstrate how a standardized approach can be used to create and scale test solutions using PXI systems. We will explore both software and hardware aspects of the problem and discuss potential hybrid solutions.
