Lecture

Advanced 3D laser triangulation sensors for the inspection of electronic components

  • at -
  • Hall B2B2.441
  • Language: English
  • Type: Lecture

Lecture description

This presentation highlights the latest advancements of AT Sensors in 3D laser triangulation scanners, featuring Widely Advanced Rapid Profiling imagers (WARP) for enhanced speed and a unique laser line projection technology—available in both single- and dual-head configurations. We will showcase how these sensors deliver high repeatability and exceptional precision at fast profile speeds, using selected examples from 3D inspection applications in the electronics industry.

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