Lecture
Latest trends in automotive electronics and semiconductor analytics - micro-XRF based depth and distribution analysis
- at -
- A3.527
- Type: Lecture
Lecture description
Abstract: This presentation showcases the development of a state-of-the-art Micro-X-ray Fluorescence (µXRF) spectroscopic method for advanced, nondestructive failure analysis. A key innovation is the experimental information depth determination and subsequent material residue composition analysis in different material matrices. The accuracy of these nondestructive elemental findings is rigorously verified through a multi-modal approach, including physical cross-sectioning and laser decapsulation, extended by FT-IR spectroscopy for molecular identification and near surface information depth determination. The effectiveness of this analytical capability is demonstrated through its successful application in resolving complex material system deviations. This integrated methodology establishes a powerful, state-of-the-art solution for critical quality and reliability challenges in the R&D and manufacturing segments in automotive electronics industry
